X-50 Analyzer

The X-50 features SiPiN detector technology (detector technology prior to the advent of silicon drift detectors, SDD). SiPiN technology processes count rates that are 10 – 20x lower than silicon drift detectors and has a resolution that is approximately 70 eV lower (peak separation is slightly worse). However, for many applications, such as sorting stainless steel, high-temperature and copper alloys, or analyzing heavy metals in soils, ores, powders, etc., SiPiN technology is perfectly adequate.

However, the X-50 does not measure magnesium (Mg), aluminum (Al), or silicon (Si) in alloys. For some materials, the X-50 can measure phosphorus (P) and sulfur (S) at the 1% level. Detection limits are approximately three times higher compared to SDD versions of the X. However, the X-50 offers a particularly attractive price and includes the same advanced X-ray tube as the other X models (operating up to max. 50 kV), an integrated camera, a macro camera, and the Android operating system platform. The X-50 is available for alloys, environmental, mining/exploration, precious metals, automotive catalysts, coatings, and an empirical app for industrial and customizable applications. The device can be factory calibrated using the FP method (Fundamental Parameter), Compton normalization (EPA method 6200), or custom empirical calibrations.